Classification On Mixedwm38
Metriken
Accuracy
MCC
Ergebnisse
Leistungsergebnisse verschiedener Modelle zu diesem Benchmark
Modellname | Accuracy | MCC | Paper Title | Repository |
|---|---|---|---|---|
| WaferSegClassNet | 0.9820 | 0.9815 | WaferSegClassNet -- A Light-weight Network for Classification and Segmentation of Semiconductor Wafer Defects | - |
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